Exnodes specializes in providing advanced onboard inspection solutions for tool process monitoring in the semiconductor manufacturing industry. The company leverages cutting-edge technologies such as Computational Parallel Illumination and Computational Imaging to offer high-resolution, wide-field defect detection. Exnodes' systems are capable of detecting defects ranging from 8.9 nm to 100 nm, validated by industry leaders. Their real-time feedback and feedforward loops are designed to maximize yield in high-volume manufacturing environments. The compact footprint of their inspection modules allows for seamless integration into existing manufacturing processes. Exnodes serves semiconductor manufacturers who require high sensitivity and throughput inspection, processing up to 120 wafers per hour at 20 nm SiO2 sensitivity. The business model revolves around selling these high-tech inspection systems and providing ongoing support and updates. Revenue is generated through the sale of hardware, software licenses, and maintenance contracts.

Keywords: semiconductor, onboard inspection, defect detection, high sensitivity, real-time feedback, feedforward loops, Computational Imaging, high-volume manufacturing, yield maximization, compact footprint.